field emission microscopy
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Field emission microscopy — (FEM) is an analytical technique used in materials science to investigate molecular surface structures and their electronic properties. [cite web | title = Intro to Field Emission | publisher = Field Emission / Ion Microscopy Laboratory, Purdue… … Wikipedia
field emission microscope — noun the instrument used in field emission microscopy … Wiktionary
Field emission gun — A field emission gun is a type of electron gun in which the emitter tip is held at several kilovolts negative potential relative to a nearby electrode, so that there is sufficient potential gradient at its surface to cause field emission of… … Wikipedia
Field ion microscope — Field ion microscopy (FIM) is an analytical technique used in materials science. The field ion microscope is a type of microscope that can be used to image the arrangement of atoms at the surface of a sharp metal tip.It was the first technique by … Wikipedia
Field electron emission — It is requested that a diagram or diagrams be included in this article to improve its quality. For more information, refer to discussion on this page and/or the listing at Wikipedia:Requested images. Field emission (FE) (also known as field… … Wikipedia
Microscopy — is the technical field of using microscopes to view samples and objects that cannot be seen with the unaided eye (objects that are not within the resolution range of the normal eye). There are three well known branches of microscopy, optical,… … Wikipedia
Transmission electron microscopy — A TEM image of the polio virus. The polio virus is 30 nm in size.[1] Transmission electron microscopy (TEM) is a microscopy technique whereby a beam of electrons is transmitted through an ultra thin specimen, interacting with the specimen as it… … Wikipedia
Photoemission electron microscopy — (PEEM, also called photoelectron microscopy, PEM) is a widely used type of emission microscopy. PEEM utilizes local variations in electron emission to generate image contrast. The excitation is usually produced by UV light, synchrotron radiation… … Wikipedia
Near-field scanning optical microscope — Near field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. This is done by placing the detector very… … Wikipedia
Scanning probe microscopy — Part of a series of articles on Nanotechnology … Wikipedia